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EDX6000C Benchtop XRF Spectrometer For Multi Sample Elemental Analysis Of Solids And Liquids

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EDX6000C Benchtop XRF Spectrometer For Multi Sample Elemental Analysis Of Solids And Liquids

Certification : CE&ISO

Analytical Method : Energy Dispersive X-ray Fluorescence (EDXRF)

Brand Name : SKYRAY

Delivery Time : 15 days

Testing Atmosphere : Atmospheric, Vacuum, Helium

Analytical Detection Limit : As low as 0.2 ppm (for light matrices)

Payment Terms : L/C,T/T

Excitation Source : Tube voltage 5~50kV, tube current 0~1000uA

Temperature Range : 15°C to 30°C

Analytical Accuracy : <0.05%

Sample Types : Solids, powders and liquids

MOQ : 1 set

Place of Origin : Kunshan, China

Price : $39,500-45,600 / set

Model Number : EDX6000C

Product Type : Benchtop XRF Spectrometer

Supply Ability : 1000pcs/month

Detector Energy Resolution : SDD detector, ≤129eV

Packaging Details : Wooden case

Elemental Analysis Range : Fluorine (F) to Uranium (U)

Sample Chamber Options : 9-position rotating, 12-position or 20-position; configuration to be confirmed

Analytical Range : ppm to 99.99%

Power Supply : AC 220V ± 5V

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Benchtop XRF Spectrometer for Multi-Sample Elemental Analysis of Solids and Liquids
Quick Overview

The EDX6000C is a benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer for elemental analysis of solids, powders, and liquids. With an elemental analysis range from fluorine (F) to uranium (U), this instrument combines an SDD detector with atmospheric, vacuum, and helium testing conditions. It supports single-sample testing and offers optional multi-sample chamber configurations for routine laboratory applications.

Instrument Description

Designed for laboratories testing diverse materials, the EDX6000C features a large-area SDD detector, an X-ray tube with an ultra-thin beryllium window, and an ultra-low-loss optical path. The detection limit can reach as low as 0.2 ppm for light matrices, though actual results vary based on element, sample matrix, preparation, and test conditions.

The integrated software automatically recognizes sample materials and selects appropriate analysis curves. One-click testing is available for both liquid and solid samples. For light-element analysis, the system supports vacuum testing for powders and helium testing for liquids.

Sample chamber configurations include: a 9-position chamber with rotating sample cups, or 12-position and 20-position chambers with single-chamber switching capability. These are configuration options, so the specific chamber type should be confirmed when ordering. The instrument includes safety features such as sample-cover interlock and detector protection.

Applications
  • Environmental soil, solid waste, and soil remediation samples
  • Geological samples and minerals
  • Alloy composition analysis, including copper alloys and stainless steel
  • Harmful-element screening for RoHS, ELV, toys, and related products
  • Metal coating thickness and plating materials
  • Gold, silver, platinum, and jewelry analysis
  • Petroleum and chemical products
  • Building materials such as cement, glass, and refractories
  • Feed and fertilizers
  • Other inorganic materials requiring elemental analysis
EDX6000C Technical Specifications
Parameter Specification
Model EDX6000C
Instrument Type Benchtop Energy Dispersive X-ray Fluorescence (EDXRF) Spectrometer
Elemental Analysis Range Fluorine (F) to Uranium (U)
Analytical Detection Limit As low as 0.2 ppm for light matrices
Analytical Content Range ppm level to 99.99%
Analytical Accuracy <0.05% RSD for repeated measurements of main elements in samples with content >96%
Detector Silicon Drift Detector (SDD)
Detector Energy Resolution ≤129 eV
Excitation Source X-ray tube, 5-50 kV; tube current 0-1000 µA
High-Voltage Generator Spellman high-voltage generator
Testing Atmospheres Air, vacuum and helium
Sample Introduction PLC-controlled; 9-position chamber with cup rotation, 12-position chamber with single-chamber switching, or 20-position chamber with single-chamber switching
Analysis Functions Automatic or manual selection of analysis and identification modes; matrix-effect correction; multivariate nonlinear regression
Operating Temperature 15-30 °C
Power Supply AC 220 V ± 5 V; a stabilized power supply is recommended
Instrument Dimensions 646 (W) × 578 (D) × 388 (H) mm
Sample Chamber Dimensions Ø340 × 64 (H) mm
Instrument Weight 85 kg

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EDX6000C Benchtop XRF Spectrometer For Multi Sample Elemental Analysis Of Solids And Liquids Images

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